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TTTC's
Electronic Broadcasting Service |
IEEE
8th IEEE International Workshop on Silicon Debug and Diagnosis Immediately following the 2012 International Test Conference |
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FOR PAPERS |
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| Scope | |||
Troubleshooting how and why systems and circuits fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, correcting the design function, failure mode learning for R&D, or just getting a working first prototype. This detective work is however very tricky. Sources of difficulty include circuit and system complexity, packaging, limited physical access, shortened product creation cycle and time-to-market. New and efficient solutions for debug and diagnosis have a much needed and highly visible impact on productivity. SDD 2012 will be held in Anaheim, California, USA. It is the eighth of a series of highly successful technical workshops that consider issues related to debug & diagnosis of semiconductor circuits and systems - from prototype bring-up to volume production. The topics of interest include, but are not limited to, the following:
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| Submissions | |||
The workshop objective is to facilitate an interactive information exchange. Extended abstracts and papers may be short. Proposals that describe open issues, industry/technology needs or opinions are valuable to the program. The SDD 2012 workshop does not have a formal proceedings, however an informal digest of papers will be distributed to the workshop participants. Furthermore, the authors of the best contributions to the SDD 2012 workshop will be invited by the program and general chair to submit an extended version of their work to a special section on Silicon Debug and Diagnosis to be published by IEEE Design & Test of Computers in Summer 2013. Length Guideline: ranging from one page extended abstract to 8 pages. Proposals for discussion panels, new topics and other special sessions are also invited. Much of the success of the event has been a result of crafting sessions based on participant interest. Please submit a 1 page abstract or discuss the issue with Program or Special Sessions Chairs. |
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| Key Dates | |||
Submission deadline: September 7, 2012 |
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| Additional Information | |||
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| Committees | |||
General Chair: Program Chair: Special Sessions: Finance Chair: Asian Liaison: European Liaison: Electronic Media: Program Committee: Steering Committee: |
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more information, visit us on the web at: http://sdd.tttc-events.org |
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| The 8th IEEE International Workshop on Silicon Debug and Diagnosis(SDD 2012) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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IEEE
Computer Society- Test Technology Technical Council |
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TTTC
CHAIR PAST
CHAIR TTTC
1ST VICE CHAIR SECRETARY ITC GENERAL CHAIR TEST
WEEK COORDINATOR TUTORIALS
AND EDUCATION STANDARDS EUROPE MIDDLE
EAST & AFRICA STANDING
COMMITTEES ELECTRONIC
MEDIA |
PRESIDENT OF BOARD SENIOR
PAST CHAIR TTTC 2ND VICE CHAIR FINANCE IEEE DESIGN & TEST EIC TECHNICAL
MEETINGS TECHNICAL
ACTIVITIES ASIA
& PACIFIC LATIN
AMERICA NORTH
AMERICA COMMUNICATIONS INDUSTRY
ADVISORY BOARD |
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